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"Embedding statistical tests for on-chip dynamic voltage and temperature ..."

Lionel Vincent et al. (2012)

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DOI: 10.1145/2228360.2228539

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Lionel Vincent, Philippe Maurine, Suzanne Lesecq, Edith Beigné:
Embedding statistical tests for on-chip dynamic voltage and temperature monitoring. DAC 2012: 994-999

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