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"PATEGE: an automatic DC parametric test generation system for series gated ..."

Takuji Ogihara, Shuichi Saruyama, Shinichi Murai (1985)

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DOI: 10.1145/317825.317859

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/OgiharaSM85
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Takuji Ogihara, Shuichi Saruyama, Shinichi Murai:
PATEGE: an automatic DC parametric test generation system for series gated ECL circuits. DAC 1985: 212-218

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