"Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits."

Irith Pomeranz (2001)

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DOI: 10.1145/378239.378385

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Irith Pomeranz:
Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits. DAC 2001: 145-150

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