BibTeX record conf/dac/ShihA86

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@inproceedings{DBLP:conf/dac/ShihA86,
  author    = {Hsi{-}Ching Shih and
               Jacob A. Abraham},
  editor    = {Don Thomas},
  title     = {Transistor-level test generation for physical failures in {CMOS} circuits},
  booktitle = {Proceedings of the 23rd {ACM/IEEE} Design Automation Conference. Las
               Vegas, NV, USA, June, 1986},
  pages     = {243--249},
  publisher = {{IEEE} Computer Society Press},
  year      = {1986},
  url       = {https://doi.org/10.1145/318013.318052},
  doi       = {10.1145/318013.318052},
  timestamp = {Tue, 06 Nov 2018 16:58:18 +0100},
  biburl    = {https://dblp.org/rec/conf/dac/ShihA86.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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