BibTeX record conf/dac/TengCRK96

download as .bib file

@inproceedings{DBLP:conf/dac/TengCRK96,
  author    = {Chin{-}Chi Teng and
               Yi{-}Kan Cheng and
               Elyse Rosenbaum and
               Sung{-}Mo Kang},
  editor    = {Thomas Pennino and
               Ellen J. Yoffa},
  title     = {Hierarchical Electromigration Reliability Diagnosis for {VLSI} Interconnects},
  booktitle = {Proceedings of the 33st Conference on Design Automation, Las Vegas,
               Nevada, USA, Las Vegas Convention Center, June 3-7, 1996},
  pages     = {752--757},
  publisher = {{ACM} Press},
  year      = {1996},
  url       = {https://doi.org/10.1145/240518.240661},
  doi       = {10.1145/240518.240661},
  timestamp = {Tue, 06 Nov 2018 16:58:18 +0100},
  biburl    = {https://dblp.org/rec/conf/dac/TengCRK96.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics