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"Improving the Test Quality for Scan-Based BIST Using a General Test ..."

Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik (1999)

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DOI: 10.1145/309847.310050

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik:
Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme. DAC 1999: 748-753

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