"Automatic test generation for large digital circuits."

Akihiko Yamada et al. (1977)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2012-03-01

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  dblp key:
  - conf/dac/YamadaWSITF77
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  - https://dblp.org/rec/conf/dac/YamadaWSITF77
Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu:
Automatic test generation for large digital circuits. DAC 1977: 78-83

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