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"Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs."

Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz (2008)

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DOI: 10.1109/DATE.2008.4484925

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/date/BahukudumbiCK08
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  persistent URL:
  - https://dblp.org/rec/conf/date/BahukudumbiCK08
Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz:
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. DATE 2008: 1103-1106

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