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"On the Use of an Oscillation-Based Test Methodology for CMOS ..."

Vincent Beroulle et al. (2002)

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DOI: 10.1109/DATE.2002.998476

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/BeroulleBLN02
Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120

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