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"A Boolean model for delay fault testing of emerging digital technologies ..."

Marcello Dalpasso, Davide Bertozzi, Michele Favalli (2018)

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DOI: 10.23919/DATE.2018.8342024

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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Marcello Dalpasso, Davide Bertozzi, Michele Favalli:
A Boolean model for delay fault testing of emerging digital technologies based on ambipolar devices. DATE 2018: 297-300

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