"Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation."

Georges G. E. Gielen, Elie Maricau, Pieter De Wit (2011)

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DOI: 10.1109/DATE.2011.5763239

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Georges G. E. Gielen, Elie Maricau, Pieter De Wit:
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. DATE 2011: 1474-1479

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