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"Test cost reduction for multiple-voltage designs with bridge defects ..."
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod (2009)
- S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod:
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing. DATE 2009: 1349-1354
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