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"Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge ..."

Weihua Liu et al. (2019)

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DOI: 10.23919/DATE.2019.8714941

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-21

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Weihua Liu, Fei Wu, Meng Zhang, Yifei Wang, Zhonghai Lu, Xiangfeng Lu, Changsheng Xie:
Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash. DATE 2019: 312-315

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