"Reuse-based test access and integrated test scheduling for network-on-chip."

Chunsheng Liu, Zach Link, Dhiraj K. Pradhan (2006)

> Home

Details and statistics

DOI: 10.1109/DATE.2006.244143

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/date/LiuLP06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/LiuLP06
Chunsheng Liu, Zach Link, Dhiraj K. Pradhan:
Reuse-based test access and integrated test scheduling for network-on-chip. DATE 2006: 303-308

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.