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"Reuse-based test access and integrated test scheduling for network-on-chip."

Chunsheng Liu, Zach Link, Dhiraj K. Pradhan (2006)

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DOI: 10.1109/DATE.2006.244143

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/LiuLP06
Chunsheng Liu, Zach Link, Dhiraj K. Pradhan:
Reuse-based test access and integrated test scheduling for network-on-chip. DATE 2006: 303-308

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