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"On Functional Test Generation for Deep Neural Network IPs."

Bo Luo et al. (2019)

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DOI: 10.23919/DATE.2019.8715042

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  dblp key:
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Bo Luo, Yu Li, Lingxiao Wei, Qiang Xu:
On Functional Test Generation for Deep Neural Network IPs. DATE 2019: 1010-1015

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