"Slow write driver faults in 65nm SRAM technology: analysis and March test ..."

Alexandre Ney et al. (2007)

> Home

Details and statistics

DOI: 10.1109/DATE.2007.364647

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/date/NeyGLPVB07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/NeyGLPVB07
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.