"RTL Test Pattern Generation for High Quality Loosely Deterministic BIST."

Marcelino B. Santos et al. (2003)

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DOI: 10.1109/DATE.2003.10010

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira:
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE 2003: 10994-10999

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