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"CCII+ current conveyor based BIC monitor for IDDQ testing of ..."

Viera Stopjaková, Hans A. R. Manhaeve (1997)

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DOI: 10.1109/EDTC.1997.582369

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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  - https://dblp.org/rec/conf/date/StopjakovaM97
Viera Stopjaková, Hans A. R. Manhaeve:
CCII+ current conveyor based BIC monitor for I_DDQ testing of complex CMOS circuits. ED&TC 1997: 266-270

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