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"Analysis and Minimization of Test Time in a Combined BIST and External ..."

Makoto Sugihara, Hiroto Yasuura, Hiroshi Date (2000)

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DOI: 10.1109/DATE.2000.840029

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/SugiharaYD00
Makoto Sugihara, Hiroto Yasuura, Hiroshi Date:
Analysis and Minimization of Test Time in a Combined BIST and External Test Approach. DATE 2000: 134-140

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