"PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs."

Daniela De Venuto, Leonardo Reyneri (2008)

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DOI: 10.1109/DATE.2008.4484899

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Daniela De Venuto, Leonardo Reyneri:
PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs. DATE 2008: 284-287

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