Stop the war!
Остановите войну!
for scientists:
default search action
"Interactive presentation: BIST method for die-level process parameter ..."
Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez (2007)
- Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez:
Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. DATE 2007: 1301-1306
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.