"A Testable Random Bit Generator Based on a High Resolution Phase Noise ..."

Marco Bucci, Raimondo Luzzi (2007)

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DOI: 10.1109/DDECS.2007.4295249

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Marco Bucci, Raimondo Luzzi:
A Testable Random Bit Generator Based on a High Resolution Phase Noise Detection. DDECS 2007: 23-28

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