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"On test time reduction using pattern overlapping, broadcasting and on-chip ..."

Martin Chloupek, Ondrej Novák, Jiri Jenícek (2012)

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DOI: 10.1109/DDECS.2012.6219078

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/ddecs/ChloupekNJ12
Martin Chloupek, Ondrej Novák, Jiri Jenícek:
On test time reduction using pattern overlapping, broadcasting and on-chip decompression. DDECS 2012: 300-305

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