BibTeX record conf/dft/DasguptaK95

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@inproceedings{DBLP:conf/dft/DasguptaK95,
  author    = {Aurobindo Dasgupta and
               Ramesh Karri},
  title     = {Switch level hot-carrier reliability enhancement of {VLSI} circuits},
  booktitle = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
               November 13-15, 1995},
  pages     = {63--71},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {https://doi.org/10.1109/DFTVS.1995.476938},
  doi       = {10.1109/DFTVS.1995.476938},
  timestamp = {Wed, 17 May 2017 10:54:38 +0200},
  biburl    = {https://dblp.org/rec/conf/dft/DasguptaK95.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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