"Power Supply Current Test Approach for Resistive Fault Screening in ..."

Marco S. Dragic, Martin Margala (2003)

> Home

Details and statistics

DOI: 10.1109/DFTVS.2003.1250103

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/DragicM03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/DragicM03
Marco S. Dragic, Martin Margala:
Power Supply Current Test Approach for Resistive Fault Screening in Embedded Analog Circuits. DFT 2003: 124-131

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.