"Parametric counterfeit IC detection via Support Vector Machines."

Ke Huang, John M. Carulli Jr., Yiorgos Makris (2012)

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DOI: 10.1109/DFT.2012.6378191

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ke Huang, John M. Carulli Jr., Yiorgos Makris:
Parametric counterfeit IC detection via Support Vector Machines. DFT 2012: 7-12

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