"Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output ..."

Yukiya Miura, Jiro Kato (2006)

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DOI: 10.1109/DFT.2006.30

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yukiya Miura, Jiro Kato:
Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics. DFT 2006: 410-418

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