"Diagnosis of Analog Circuits by Using Multiple Transistors and Data Sampling."

Yukiya Miura, Jiro Kato (2008)

Details and statistics

DOI: 10.1109/DFT.2008.31

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics