"A low overhead built-in delay testing with voltage and frequency ..."

Kyu-Nam Shim, Jiang Hu (2012)

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DOI: 10.1109/DFT.2012.6378219

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kyu-Nam Shim, Jiang Hu:
A low overhead built-in delay testing with voltage and frequency adaptation for variation resilience. DFT 2012: 170-177

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