"Mobility Enhancement and Reliability Characterization of Back-Channel-Etch ..."

Chia-Chun Yen et al. (2020)

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DOI: 10.1109/DRC50226.2020.9135180

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-27

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  - conf/drc/YenTLYL20
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  - https://dblp.org/rec/conf/drc/YenTLYL20
Chia-Chun Yen, An-Hung Tai, Yu-Chieh Liu, Chun-Hung Yeh, C. W. Liu:
Mobility Enhancement and Reliability Characterization of Back-Channel-Etch Amorphous InGaZnO TFT with Double Layers. DRC 2020: 1-2

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