"Smart Sensing of Multi-bit Resistive Memory using a Single Reference."

John Reuben, Dietmar Fey (2025)

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DOI: 10.1109/DSD67783.2025.00063

access: closed

type: Conference or Workshop Paper

metadata version: 2026-01-13

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John Reuben, Dietmar Fey:
Smart Sensing of Multi-bit Resistive Memory using a Single Reference. DSD 2025: 410-417

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