"On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for ..."

Michal Rumplík, Josef Strnadel (2011)

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DOI: 10.1109/DSD.2011.51

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Michal Rumplík, Josef Strnadel:
On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for Scan Circuits. DSD 2011: 367-374

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