"DNAttest: Digital-twin-based Non-intrusive Attestation under Transient ..."

Wei Lin et al. (2023)

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DOI: 10.1109/DSN58367.2023.00044

access: closed

type: Conference or Workshop Paper

metadata version: 2025-08-05

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Wei Lin, Heng Chuan Tan, Binbin Chen, Fan Zhang:
DNAttest: Digital-twin-based Non-intrusive Attestation under Transient Uncertainty. DSN 2023: 376-388

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