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"Modelling and measurements of thermomechanical stress induced drift on ..."

Lorenzo Benvenuti et al. (2019)

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DOI: 10.1109/DTIS.2019.8734970

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  - conf/dtis/BenvenutiBFCCPT19
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Lorenzo Benvenuti, Paolo Bruschi, Luca Fanucci, Raffaele Coppeta, Sara Carniello, Luigi Di Piro, Francesco Tinfena:
Modelling and measurements of thermomechanical stress induced drift on polysilicon resistors with different layout. DTIS 2019: 1-5

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