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"Accurate multiplexed test structure for threshold voltage matching evaluation."

Loic Welter et al. (2014)

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DOI: 10.1109/DTIS.2014.6850657

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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  - conf/dtis/WelterDIAP14
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Loic Welter, Philippe Dreux, Jordan Innocenti, Hassen Aziza, Jean-Michel Portal:
Accurate multiplexed test structure for threshold voltage matching evaluation. DTIS 2014: 1-6

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