"Empirical Fault Patterns for Mutation Testing."

Sophia Hans, Matthias Kettl, Stefan Winter (2025)

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DOI: 10.1145/3756681.3756963

access: closed

type: Conference or Workshop Paper

metadata version: 2026-02-03

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  - conf/ease/HansK025
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Sophia Hans, Matthias Kettl, Stefan Winter:
Empirical Fault Patterns for Mutation Testing. EASE 2025: 205-215

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