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"Defect inspection technology for a gloss-coated surface using patterned ..."

Tsuyoshi Nagato, Takashi Fuse, Tetsuo Koezuka (2013)

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DOI: 10.1117/12.2001768

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-02

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  - conf/ei-ipmva/NagatoFK13
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Tsuyoshi Nagato, Takashi Fuse, Tetsuo Koezuka:
Defect inspection technology for a gloss-coated surface using patterned illumination. Image Processing: Machine Vision Applications 2013: 866110

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