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"Study on The Degradations Produced by Different P-base Diffusion ..."
Xinyu Li et al. (2021)
- Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Xingyu Fang, Zhonghan Deng:
Study on The Degradations Produced by Different P-base Diffusion Temperatures on SGT MOSFET With Approximate Threshold Voltage. EITCE 2021: 226-231
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