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"Test-Retest Reliability of Time-Domain EEG Features to Assess Cognitive ..."
Oscar Ortiz, Daniel H. Blustein, Usha Kuruganti (2020)
- Oscar Ortiz, Daniel H. Blustein, Usha Kuruganti:
Test-Retest Reliability of Time-Domain EEG Features to Assess Cognitive Load Using a Wireless Dry-Electrode System. EMBC 2020: 2885-2888
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