"Test-Retest Reliability of Time-Domain EEG Features to Assess Cognitive ..."

Oscar Ortiz, Daniel H. Blustein, Usha Kuruganti (2020)

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DOI: 10.1109/EMBC44109.2020.9175762

access: closed

type: Conference or Workshop Paper

metadata version: 2021-09-27

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Oscar Ortiz, Daniel H. Blustein, Usha Kuruganti:
Test-Retest Reliability of Time-Domain EEG Features to Assess Cognitive Load Using a Wireless Dry-Electrode System. EMBC 2020: 2885-2888

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