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"Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk ..."
Sylvain Clerc et al. (2021)
- Sylvain Clerc, Kedar Janardan Dhori, Robin M. Wilson, Rohit Goel, Sébastien Marchal, Franck Pourchon, Christian Dutto, Ricardo Gomez Gomez:
Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS technologies. ESSCIRC 2021: 271-274
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