Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Reliability of capacitive RF MEMS switches subjected to repetitive impact ..."

Marco Barbato et al. (2014)

> Home

Details and statistics

DOI: 10.1109/ESSDERC.2014.6948760

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/essderc/BarbatoCMMPSM14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/essderc/BarbatoCMMPSM14
Marco Barbato, Andrea Cester, Viviana Mulloni, Benno Margesin, Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso:
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures. ESSDERC 2014: 70-73

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.