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"Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC."

Alessandro Pezzotta et al. (2016)

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DOI: 10.1109/ESSDERC.2016.7599608

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-07

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  - conf/essderc/PezzottaZJBBFMB16
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  - https://dblp.org/rec/conf/essderc/PezzottaZJBBFMB16
Alessandro Pezzotta, C.-M. Zhang, Farzan Jazaeri, Claudio Bruschini, Giulio Borghello, Federico Faccio, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz:
Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC. ESSDERC 2016: 146-149

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