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"Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and ..."
Andrea Vici et al. (2019)
- Andrea Vici, Felice Russo, Nicola Lovisi, Aldo Marchioni, Antonio Casella, Fernanda Irrera:
Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability. ESSDERC 2019: 234-237
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