"Soft-Error Rate Testing of Deep-Submicron Integrated Circuits."

Tino Heijmen, André Nieuwland (2006)

Details and statistics

DOI: 10.1109/ETS.2006.42

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics