"Disturbance fault testing on various NAND flash memories."

Chih-Sheng Hou, Jin-Fu Li (2012)

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DOI: 10.1109/ETS.2012.6233030

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Chih-Sheng Hou, Jin-Fu Li:
Disturbance fault testing on various NAND flash memories. ETS 2012: 1

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