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"Automatic generation of in-circuit tests for board assembly defects."

Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen (2018)

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DOI: 10.1109/ETS.2018.8400714

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/ets/SchaaijkSM18
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Harm van Schaaijk, Martien Spierings, Erik Jan Marinissen:
Automatic generation of in-circuit tests for board assembly defects. ETS 2018: 1-2

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