"Gate-Delay Fault Test with Conventional Scan-Design."

Arno Kunzmann, Frank Böhland (1994)

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DOI: 10.1109/EDTC.1994.326825

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Arno Kunzmann, Frank Böhland:
Gate-Delay Fault Test with Conventional Scan-Design. EDAC-ETC-EUROASIC 1994: 524-528

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