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"A Low Cost BIST Methodology and Associated Novel Test Pattern Generator."

Sen-Pin Lin, Sandeep K. Gupta, Melvin A. Breuer (1994)

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DOI: 10.1109/EDTC.1994.326890

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-21

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  dblp key:
  - conf/eurodac/LinGB94
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  - https://dblp.org/rec/conf/eurodac/LinGB94
Sen-Pin Lin, Sandeep K. Gupta, Melvin A. Breuer:
A Low Cost BIST Methodology and Associated Novel Test Pattern Generator. EDAC-ETC-EUROASIC 1994: 106-112

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