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"Qualifying Dependent Failure Analysis Within ISO26262: Applicability to ..."

Alison Young, Alastair Walker (2018)

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DOI: 10.1007/978-3-319-97925-0_27

access: closed

type: Conference or Workshop Paper

metadata version: 2018-08-23

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Alison Young, Alastair Walker:
Qualifying Dependent Failure Analysis Within ISO26262: Applicability to Semiconductors. EuroSPI 2018: 331-340

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