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"Parametric yield in FPGAs due to within-die delay variations: a ..."

N. Pete Sedcole, Peter Y. K. Cheung (2007)

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DOI: 10.1145/1216919.1216949

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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N. Pete Sedcole, Peter Y. K. Cheung:
Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis. FPGA 2007: 178-187

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